RT Journal Article
JF 2007 16th International Conference on Parallel Architectures and Compilation Techniques
YR 2007
VO 00
IS
SP 424
TI Reducing the Impact of Process Variability with Prefetching and Criticality-Based Resource Allocation
A1 Sule Ozev,
A1 Michael E. Bauer,
A1 Bogdan F. Romanescu,
A1 Daniel J. Sorin,
K1 null
AB A major problem facing the computer and semi-conductor industries is the increasing amount of CMOS process variability [1, 3]. Variability in low-level circuit parameters, such as transistor gate length and gate oxide thickness, complicates system design by introducing uncertainty about how a fabricated system will perform. Although a circuit or chip is designed to run at a nominal clock frequency, the fabricated implementation may vary far from this expected performance.
PB IEEE Computer Society, [URL:http://www.computer.org]
SN 1089-795X
LA English
DO 10.1109/PACT.2007.59
LK http://doi.ieeecomputersociety.org/10.1109/PACT.2007.59