RT Journal Article
JF IEEE Design & Test of Computers
YR 2010
VO 27
IS
SP 2
TI Enabling design and manufacturing through innovations in DFT
K1 design and test
K1 fault diagnosis
K1 process methodology
K1 self-testing
AB <p>This issue of <it>D&#x0026;T</it> includes five articles on various aspects of testing. The issue leads off with a tutorial on software-based self-testing of microprocessors, followed by four in-depth articles on aspects of test technology. This issue also features the second part of a Perspectives article on an NSF workshop. Columns include The Road Ahead, Book Reviews, and Conference Reports.</p>
PB IEEE Computer Society, [URL:http://www.computer.org]
SN 0740-7475
LA English
DO 10.1109/MDT.2010.74
LK http://doi.ieeecomputersociety.org/10.1109/MDT.2010.74