RT Journal Article
JF IEEE Design & Test of Computers
YR 2008
VO 25
SP 105
TI Test compression saves bits, cycles, and money
A1 Tim Cheng,
K1 test compression
K1 test vectors
K1 RFIC chips
K1 Bob Dennard
AB Test data compression became an active research topic in the late 1990s, and has now become a standard offering within commercial DFT solutions. This issue of IEEE Design & Test features a special issue on the current state of test compression. This issue of D&T also concludes the theme of design and test of RFIC chips (featured in the Jan./Feb. 08 issue), with two additional articles. In addition, this issue features two general-interest articles and an interview with DRAM inventor Bob Dennard.
PB IEEE Computer Society, [URL:http://www.computer.org]
SN 0740-7475
LA English
DO 10.1109/MDT.2008.52
LK http://doi.ieeecomputersociety.org/10.1109/MDT.2008.52