@article{10.1109/MDT.2010.130,
author = {},
title = {Departments [Table of Contents]},
journal = {IEEE Design & Test of Computers},
volume = {27},
number = {6},
issn = {0740-7475},
year = {2010},
pages = {1},
doi = {doi.ieeecomputersociety.org/10.1109/MDT.2010.130},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
@article{10.1109/MDT.2010.127,
author = {},
title = {Call for Papers},
journal = {IEEE Design & Test of Computers},
volume = {27},
number = {},
issn = {0740-7475},
year = {2010},
pages = {3},
doi = {doi.ieeecomputersociety.org/10.1109/MDT.2010.127},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
@article{10.1109/MDT.2010.134,
author = {Swarup Bhunia, and Rahul Rao, },
title = {Guest Editors' Introduction: Managing Uncertainty through Postfabrication Calibration and Repair},
journal = {IEEE Design & Test of Computers},
volume = {27},
number = {},
issn = {0740-7475},
year = {2010},
pages = {4-5},
doi = {doi.ieeecomputersociety.org/10.1109/MDT.2010.134},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
@article{10.1109/MDT.2010.135,
author = {Krishnendu Chakrabarty, },
title = {Increasing yield and reliability through postsilicon tuning},
journal = {IEEE Design & Test of Computers},
volume = {27},
number = {},
issn = {0740-7475},
year = {2010},
pages = {2},
doi = {doi.ieeecomputersociety.org/10.1109/MDT.2010.135},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
@article{10.1109/MDT.2010.95,
author = {Rajiv Joshi, and Yuen Chan, and Rouwaida Kanj, and Arthur tuminaro, and Anthony Pelella, },
title = {The Dawn of Predictive Chip Yield Design: Along and Beyond the Memory Lane},
journal = {IEEE Design & Test of Computers},
volume = {27},
number = {},
issn = {0740-7475},
year = {2010},
pages = {36-45},
doi = {doi.ieeecomputersociety.org/10.1109/MDT.2010.95},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
@article{10.1109/MDT.2010.94,
author = {Mohammad Al Faruque, and Joerg Henkel, and Janmartin Jahn, },
title = {Runtime Thermal Management Using Software Agents for Multi- and Many-Core Architectures},
journal = {IEEE Design & Test of Computers},
volume = {27},
number = {},
issn = {0740-7475},
year = {2010},
pages = {58-68},
doi = {doi.ieeecomputersociety.org/10.1109/MDT.2010.94},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
@article{10.1109/MDT.2010.123,
author = {Ganesh Srinivasan, and Shreyas Sen, and Friedrich Taenzler, and Vishwanath Natarajan, and Aritra Banerjee, and Abhijit Chatterjee, },
title = {Analog Signature- Driven Postmanufacture Multidimensional Tuning of RF Systems},
journal = {IEEE Design & Test of Computers},
volume = {27},
number = {},
issn = {0740-7475},
year = {2010},
pages = {6-17},
doi = {doi.ieeecomputersociety.org/10.1109/MDT.2010.123},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
@article{10.1109/MDT.2010.138,
author = {Wu-Hsin Chen, and Byunghoo Jung, },
title = {Self-Healing Phase-Locked Loops in Deep-Scaled CMOS Technologies},
journal = {IEEE Design & Test of Computers},
volume = {27},
number = {},
issn = {0740-7475},
year = {2010},
pages = {18-25},
doi = {doi.ieeecomputersociety.org/10.1109/MDT.2010.138},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
@article{10.1109/MDT.2010.137,
author = {Jason Schlessman, and Saibal Mukhopadhyay, and Minki Cho, and Marilyn Wolf, and Hamid Mahmoodi, },
title = {Postsilicon Adaptation for Low-Power SRAM under Process Variation},
journal = {IEEE Design & Test of Computers},
volume = {27},
number = {},
issn = {0740-7475},
year = {2010},
pages = {26-35},
doi = {doi.ieeecomputersociety.org/10.1109/MDT.2010.137},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
@article{10.1109/MDT.2010.121,
author = {Jin-Fu Li, and Chih-Sheng Hou, and Tsu-Wei Tseng, },
title = {A Built-in Method to Repair SoC RAMs in Parallel},
journal = {IEEE Design & Test of Computers},
volume = {27},
number = {},
issn = {0740-7475},
year = {2010},
pages = {46-57},
doi = {doi.ieeecomputersociety.org/10.1109/MDT.2010.121},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
@article{10.1109/MDT.2010.136,
author = {},
title = {Masthead},
journal = {IEEE Design & Test of Computers},
volume = {27},
number = {},
issn = {0740-7475},
year = {2010},
pages = {69},
doi = {doi.ieeecomputersociety.org/10.1109/MDT.2010.136},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
@article{10.1109/MDT.2010.129,
author = {},
title = {Conference Reports},
journal = {IEEE Design & Test of Computers},
volume = {27},
number = {},
issn = {0740-7475},
year = {2010},
pages = {70-71},
doi = {doi.ieeecomputersociety.org/10.1109/MDT.2010.129},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
@article{10.1109/MDT.2010.122,
author = {},
title = {About the power problem},
journal = {IEEE Design & Test of Computers},
volume = {27},
number = {},
issn = {0740-7475},
year = {2010},
pages = {72-73},
doi = {doi.ieeecomputersociety.org/10.1109/MDT.2010.122},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
@article{10.1109/MDT.2010.128,
author = {},
title = {CEDA Currents},
journal = {IEEE Design & Test of Computers},
volume = {27},
number = {},
issn = {0740-7475},
year = {2010},
pages = {74-75},
doi = {doi.ieeecomputersociety.org/10.1109/MDT.2010.128},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
@article{10.1109/MDT.2010.139,
author = {},
title = {Test Technology TC Newsletter},
journal = {IEEE Design & Test of Computers},
volume = {27},
number = {},
issn = {0740-7475},
year = {2010},
pages = {78-79},
doi = {doi.ieeecomputersociety.org/10.1109/MDT.2010.139},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
@article{10.1109/MDT.2010.124,
author = {Stephen Kosonocky, },
title = {Are you having fun yet?},
journal = {IEEE Design & Test of Computers},
volume = {27},
number = {},
issn = {0740-7475},
year = {2010},
pages = {80},
doi = {doi.ieeecomputersociety.org/10.1109/MDT.2010.124},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
@article{10.1109/MDT.2010.131,
author = {},
title = {Design Automation Technical Committee Newsletter},
journal = {IEEE Design & Test of Computers},
volume = {27},
number = {},
issn = {0740-7475},
year = {2010},
pages = {76-77},
doi = {doi.ieeecomputersociety.org/10.1109/MDT.2010.131},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
@article{10.1109/MDT.2010.133,
author = {},
title = {Table of Contents},
journal = {IEEE Design & Test of Computers},
volume = {27},
number = {6},
issn = {0740-7475},
year = {2010},
pages = {c2},
doi = {doi.ieeecomputersociety.org/10.1109/MDT.2010.133},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}