"[Masthead]", IEEE Design & Test of Computers vol. 30 no. 2, p. 1, , 2013

"Table of contents", IEEE Design & Test of Computers vol. 30 no. 2, p. 2, , 2013

"Table of contents", IEEE Design & Test of Computers vol. 30 no. 2, p. 3, , 2013

"A look at trusted SoC with untrusted components", IEEE Design & Test of Computers vol. 30 no. 2, p. 4, , 2013

Swarup Bhunia, Dakshi Agrawal, Leyla Nazhandali, undefined, undefined, undefined, undefined, "Guest Editors' Introduction: Trusted System-on-Chip with Untrusted Components", IEEE Design & Test of Computers vol. 30 no. 2, p. 5-7, , 2013

"Practical, Lightweight Secure Inclusion of Third-Party Intellectual Property", IEEE Design & Test of Computers vol. 30 no. 2, p. 8-16, , 2013

"HELP: A Hardware-Embedded Delay PUF", IEEE Design & Test of Computers vol. 30 no. 2, p. 17-25, , 2013

"A Clock Sweeping Technique for Detecting Hardware Trojans Impacting Circuits Delay", IEEE Design & Test of Computers vol. 30 no. 2, p. 26-34, , 2013

"Securing Processors Against Insider Attacks: A Circuit-Microarchitecture Co-Design Approach", IEEE Design & Test of Computers vol. 30 no. 2, p. 35-44, , 2013

"Hardware Trojan Insertion by Direct Modification of FPGA Configuration Bitstream", IEEE Design & Test of Computers vol. 30 no. 2, p. 45-54, , 2013

"Eliminating Timing Information Flows in a Mix-Trusted System-on-Chip", IEEE Design & Test of Computers vol. 30 no. 2, p. 55-62, , 2013

"Call for Tutorial and Survey Articles", IEEE Design & Test of Computers vol. 30 no. 2, p. 63-64, , 2013

"IEEE Semantic Technology", IEEE Design & Test of Computers vol. 30 no. 2, p. 65, , 2013

"Creating Structural Patterns for At-Speed Testing: A Case Study", IEEE Design & Test of Computers vol. 30 no. 2, p. 66-76, , 2013

"Fast-Yet-Accurate Statistical Soft-Error-Rate Analysis Considering Full-Spectrum Charge Collection", IEEE Design & Test of Computers vol. 30 no. 2, p. 77-86, , 2013

"Diverse Double Modular Redundancy: A New Direction for Soft-Error Detection and Correction", IEEE Design & Test of Computers vol. 30 no. 2, p. 87-95, , 2013

"IEEE Phaser Data", IEEE Design & Test of Computers vol. 30 no. 2, p. 96, , 2013

"CEDA Currents", IEEE Design & Test of Computers vol. 30 no. 2, p. 97-98, , 2013

"Discover more. IEEE Educational Activities", IEEE Design & Test of Computers vol. 30 no. 2, p. 99, , 2013

"Test Technology TC Newsletter", IEEE Design & Test of Computers vol. 30 no. 2, p. 100-101, , 2013

"IEEE Was Here", IEEE Design & Test of Computers vol. 30 no. 2, p. 102, , 2013

"Let's stop trusting software with our sensitive data", IEEE Design & Test of Computers vol. 30 no. 2, p. 103-104, , 2013

P. Reviriego, C. J. Bleakley, J. A. Maestro, "Diverse Double Modular Redundancy: A New Direction for Soft-Error Detection and Correction", IEEE Design & Test of Computers vol. 30 no. , p. 87-95, , 2013

"Table of contents", IEEE Design & Test of Computers vol. 30 no. , p. 3, , 2013

"Technology insight on demand on IEEE.tv [advertisement]", IEEE Design & Test of Computers vol. 30 no. , p. C4, , 2013

Swarup Bhunia, Dakshi Agrawal, Leyla Nazhandali, "Guest Editors' Introduction: Trusted System-on-Chip with Untrusted Components", IEEE Design & Test of Computers vol. 30 no. , p. 5-7, , 2013

"IEEE Was Here", IEEE Design & Test of Computers vol. 30 no. , p. 102, , 2013

Kan Xiao, Xuehui Zhang, Mohammad Tehranipoor, "A Clock Sweeping Technique for Detecting Hardware Trojans Impacting Circuits Delay", IEEE Design & Test of Computers vol. 30 no. , p. 26-34, , 2013

J. Rajendran, A. K. Kanuparthi, M. Zahran, S. K. Addepalli, G. Ormazabal, R. Karri, "Securing Processors Against Insider Attacks: A Circuit-Microarchitecture Co-Design Approach", IEEE Design & Test of Computers vol. 30 no. , p. 35-44, , 2013

Theo Theocharides, "Test Technology TC Newsletter", IEEE Design & Test of Computers vol. 30 no. , p. 100-101, , 2013

"[Masthead]", IEEE Design & Test of Computers vol. 30 no. , p. 1, , 2013

"Table of contents", IEEE Design & Test of Computers vol. 30 no. , p. 2, , 2013

"Discover more. IEEE Educational Activities", IEEE Design & Test of Computers vol. 30 no. , p. 99, , 2013

"IEEE Xplore Digital Library", IEEE Design & Test of Computers vol. 30 no. , p. C3, , 2013

"IEEE Phaser Data", IEEE Design & Test of Computers vol. 30 no. , p. 96, , 2013

"IEEE Semantic Technology", IEEE Design & Test of Computers vol. 30 no. , p. 65, , 2013

"Call for Tutorial and Survey Articles", IEEE Design & Test of Computers vol. 30 no. , p. 63-64, , 2013

Andre Ivanov, "A Look at Trusted SoC With Untrusted Components", IEEE Design & Test of Computers vol. 30 no. , p. 4, , 2013

"While the world benefi ts from what's new, ieee can focus you on what's next [advertisement]", IEEE Design & Test of Computers vol. 30 no. , p. C2, , 2013

"[Front cover]", IEEE Design & Test of Computers vol. 30 no. , p. C1, , 2013

"CEDA Currents", IEEE Design & Test of Computers vol. 30 no. , p. 97-98, , 2013

C. Fletcher, M. van Dijk, S. Devadas, "Let's stop trusting software with our sensitive data", IEEE Design & Test of Computers vol. 30 no. , p. 103-104, , 2013

"[Front cover]", IEEE Design & Test of Computers vol. 30 no. 2, p. C1, , 2013

"While the world benefi ts from what's new, ieee can focus you on what's next [advertisement]", IEEE Design & Test of Computers vol. 30 no. 2, p. C2, , 2013

"IEEE Xplore Digital Library", IEEE Design & Test of Computers vol. 30 no. 2, p. C3, , 2013

"Technology insight on demand on IEEE.tv [advertisement]", IEEE Design & Test of Computers vol. 30 no. 2, p. C4, , 2013