"Departments [Table of Contents]", IEEE Design & Test of Computers vol. 27 no. 6, p. 1, , 2010

"Call for Papers", IEEE Design & Test of Computers vol. 27 no. , p. 3, , 2010

Swarup Bhunia, Rahul Rao, "Guest Editors' Introduction: Managing Uncertainty through Postfabrication Calibration and Repair", IEEE Design & Test of Computers vol. 27 no. , p. 4-5, , 2010

Krishnendu Chakrabarty, "Increasing yield and reliability through postsilicon tuning", IEEE Design & Test of Computers vol. 27 no. , p. 2, , 2010

Rajiv Joshi, Yuen Chan, Rouwaida Kanj, Arthur tuminaro, Anthony Pelella, "The Dawn of Predictive Chip Yield Design: Along and Beyond the Memory Lane", IEEE Design & Test of Computers vol. 27 no. , p. 36-45, , 2010

Mohammad Al Faruque, Joerg Henkel, Janmartin Jahn, "Runtime Thermal Management Using Software Agents for Multi- and Many-Core Architectures", IEEE Design & Test of Computers vol. 27 no. , p. 58-68, , 2010

Ganesh Srinivasan, Shreyas Sen, Friedrich Taenzler, Vishwanath Natarajan, Aritra Banerjee, Abhijit Chatterjee, "Analog Signature- Driven Postmanufacture Multidimensional Tuning of RF Systems", IEEE Design & Test of Computers vol. 27 no. , p. 6-17, , 2010

Wu-Hsin Chen, Byunghoo Jung, "Self-Healing Phase-Locked Loops in Deep-Scaled CMOS Technologies", IEEE Design & Test of Computers vol. 27 no. , p. 18-25, , 2010

Jason Schlessman, Saibal Mukhopadhyay, Minki Cho, Marilyn Wolf, Hamid Mahmoodi, "Postsilicon Adaptation for Low-Power SRAM under Process Variation", IEEE Design & Test of Computers vol. 27 no. , p. 26-35, , 2010

Jin-Fu Li, Chih-Sheng Hou, Tsu-Wei Tseng, "A Built-in Method to Repair SoC RAMs in Parallel", IEEE Design & Test of Computers vol. 27 no. , p. 46-57, , 2010

"Masthead", IEEE Design & Test of Computers vol. 27 no. , p. 69, , 2010

"Conference Reports", IEEE Design & Test of Computers vol. 27 no. , p. 70-71, , 2010

"About the power problem", IEEE Design & Test of Computers vol. 27 no. , p. 72-73, , 2010

"CEDA Currents", IEEE Design & Test of Computers vol. 27 no. , p. 74-75, , 2010

"Test Technology TC Newsletter", IEEE Design & Test of Computers vol. 27 no. , p. 78-79, , 2010

Stephen Kosonocky, "Are you having fun yet?", IEEE Design & Test of Computers vol. 27 no. , p. 80, , 2010

"Design Automation Technical Committee Newsletter", IEEE Design & Test of Computers vol. 27 no. , p. 76-77, , 2010

"Table of Contents", IEEE Design & Test of Computers vol. 27 no. 6, p. c2, , 2010